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Truer Holds a Lecture on the Functional Analysis Used in Patent Application Writing and the Visualization for Patent Mining

On the morning of June 16, 2012, China Truer IP hosted a lecture on the "Functional Analysis Used in Patent Application Writing and the Visualization for Patent Mining" in the Truer's conference room. Representatives from a variety of enterprises and public institutes, including Tsinghua University, Coship, Mindray, Hanslaser, Woer, M.P.R., ChinaGPS, WaichiLight, Tianxudong, and Zhongshan YongAnBao participated in the lecture and active discussion. All participants applauded at the end of the lecture.

During the lecture, Mr. Jiang Yaochun, General Manager of China Truer IP, provided in-depth interpretation and analysis of the functional analysis used in patent application claim writing and the visualization for patent mining, and significantly improved participants' professional skills through sharing excellent sample cases, facilitating instant and effective Q&A interactions and communication, and stating typical case practice.

This lecture's intent is to enable enterprises and public institutes to master obtaining broadly-protected and easy-to-license patents and high-value basic patents. Jiang Yaochun, the founder and General Manager of China Truer IP, promised that Truer will hold more lectures of this type in the future to provide customers with more value-added services in response to customers' sustained strong support.